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• Device Simulation and Characterization
• Charge Trapping Mechanisms in NAND Flash Memory
• Scaling Effects in NAND Memory
• 3D NAND Memory Simulation
• Optimization of Program/Erase Operations
• Reliability Analysis and Endurance Testing
• Data Retention Studies
• Variability and Statistical Analysis
• Integration with Peripheral Circuits
Process Simulation of NAND Memory Cells
• Simulation Reports: Comprehensive reports detailing the simulation setup, processes, results, and
analysis.
• Plots and Graphs: Visual representations of simulation data, including IV curves, threshold shifts,
retention characteristics, etc.
• Optimized Parameters: Recommendations for optimized design and operational parameters.
• Reliability and Performance Metrics: Documentation of reliability tests and key performance
metrics.
• Source Files: Simulation input files and scripts for reproducibility.
